Distributed in the USA by Extec Imaging.
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Steep sided flanks
Surfaces often contain steep flanks and vertical edges. These structures are difficult to measure using conventional optical methods. InfiniteFocus® allows dense and robust measurements exceeding 80°. Features several millimeters deep are robustly and traceably captured.
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InfiniteFocus® allows dense and robust measurements exceeding 80°. Features several millimeters deep are robustly and traceably captured.
Measurement results are able to be reproduced with a vertical resolution of up to 10nm. This turns InfiniteFocus® into an essential measurement tool to quantify parameters of surfaces.